Panel
Panel / Quad
Main inspection platform that detects critical defects such as cosmetic flaws, ABF void, and SR pinhole using high-resolution color imaging.
- 2–5 µm/pixel
- Color, UV, IR optical expansion
Flagship equipment lineup
Strip AFVI
Strip AFVI
AFVI product line for FC-BGA and FC-CSP strip processes with single-unit and magazine types and dual-side automatic inspection.
- 1–5 µm/pixel, Color, IR, Dent optical expansion
- Stack and Magazine configuration
Tray AFVI
Tray AFVI
Inspection platform for cosmetic defects and dent inspection with FC-BGA units loaded in JEDEC trays.
- 2.5–5 µm/pixel, Color, IR, Dent optical expansion
- Tray-in Tray-out configuration, 3D AFVI expansion
Verification System
IVS / ICS / AI
Non-contact verify flow that receives AVI images for overkill reduction, defect classification, and high-magnification re-check.
- IVS-based defect review
- iCS All-in-Focus precision review
Pixel Master
Pixel Master
Centrally manages CAM / NAS / spec databases to speed rollout and recipe propagation across machines of the same model.
- Central recipe / spec management
- Horizontal rollout across machines
Defect and verify examples
UV example
Color vs Fluorescence
DFR residue defects that are hard to see in visible light can be detected using UV fluorescence response.
IR example
Color vs IR
Open/Short patterns beneath SR can be inspected more clearly with IR than with color alone.
Dent example
Color vs Dent
Dent-type defects not visible in standard inspection images can be detected with dedicated dent optics.
Color example
Mono vs Color
Defect types that were difficult to distinguish in monochrome images become separable in color—for both operators and AI.