

Panel / Quad
Main inspection platform that detects critical defects such as cosmetic flaws, ABF void, and SR pinhole using high-resolution color imaging.
- 2–5 µm/pixel
- Color, UV, IR optical expansion
Inspection Intelligence For Yield Decisions
Panel AVI, Strip AFVI, Tray AFVI, AI filtering, IVS, ICS, and Pixel Master connected in one operational flow to improve detection and judgment efficiency on mass-production lines.
Product portfolio
Business areas
Final Visual Inspection
Inspects cosmetic defects and SR / Metal at Panel, Strip, and Unit stages.

Final Visual Inspection
Inspects via hole and crack defects with specialized optics and image processing for glass substrates.

Final Visual Inspection
High-resolution imaging for surface anomalies and cosmetic defects at wafer level.

Combine Color, UV, IR, Dent optics per processto secure defect detection data.Combine Color, UV, IR, Dent optics per process to secure defect detection data.
AI inspection for critical areas and OK/NG defect filteringto improve detection and reduce operator review load.AI inspection for critical areas and OK/NG defect filtering solutions toimprove detection and reduce operator review load.
Image-based verify and precision re-imagingto improve final OK / NG accuracy.Image-based verify and precision re-imaging to improve final OK / NG accuracy.
Combine Color, UV, IR, Dent optics per processto secure defect detection data.Combine Color, UV, IR, Dent optics per process to secure defect detection data.
AI inspection for critical areas and OK/NG defect filteringto improve detection and reduce operator review load.AI inspection for critical areas and OK/NG defect filtering solutions toimprove detection and reduce operator review load.
Image-based verify and precision re-imagingto improve final OK / NG accuracy.Image-based verify and precision re-imaging to improve final OK / NG accuracy.
Business areas